| Original language | Undefined/Unknown |
|---|---|
| Title of host publication | 21st International Conference on Pattern Recognition |
| Publication status | Published - 2012 |
Edge Classification using Photo-Geo metric features
Josep M. Gonfaus, Theo Gevers, Arjan Gijsenij, Xavier Roca, Jordi Gonzalez
Research output: Chapter in Book › Chapter › Research › peer-review