Dielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni<inf>0.5</inf>Mn<inf>0.5</inf>)O<inf>3</inf> thin films

L. E. Coy, I. Fina, J. Ventura, L. Yate, E. Langenberg, M. C. Polo, C. Ferrater, M. Varela

Research output: Contribution to journalArticleResearchpeer-review

5 Citations (Scopus)

Abstract

© 2016 Author(s). We report on the functional properties of the Y(Ni0.5Mn0.5)O3 epitaxial thin films, growth by pulsed laser deposition, observing the clear features of their ferroelectric and ferromagnetic nature at cryogenic temperature. The characterization of temperature-dependent complex impedance spectroscopy has shown a dielectric anomaly around the ferromagnetic Curie temperature (≈100 K) indicative of coupling between magnetic and electric orders.
Original languageEnglish
Article number152901
JournalApplied Physics Letters
Volume109
Issue number15
DOIs
Publication statusPublished - 10 Oct 2016

Fingerprint

Dive into the research topics of 'Dielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni<inf>0.5</inf>Mn<inf>0.5</inf>)O<inf>3</inf> thin films'. Together they form a unique fingerprint.

Cite this