Depth magnetization profile of a perpendicular exchange coupled system by soft-X-ray resonant magnetic reflectivity

J. M. Tonnerre, M. De Santis, S. Grenier, H. C.N. Tolentino, V. Langlais, E. Bontempi, M. García-Fernández, U. Staub

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Abstract

The magnetic profile across the interface of a perpendicular exchange coupled [NiO/CoO]3/Pt-Co/Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign. © 2008 The American Physical Society.
Original languageEnglish
Article number157202
JournalPhysical Review Letters
Volume100
Issue number15
DOIs
Publication statusPublished - 16 Apr 2008

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