Depth magnetization profile of a perpendicular exchange coupled system by soft-X-ray resonant magnetic reflectivity

J. M. Tonnerre; M. De Santis; S. Grenier; H. C.N. Tolentino; V. Langlais; E. Bontempi; M. García-Fernández; U. Staub

doi:10.1103/PhysRevLett.100.157202

Depth magnetization profile of a perpendicular exchange coupled system by soft-X-ray resonant magnetic reflectivity

J. M. Tonnerre, M. De Santis, S. Grenier, H. C.N. Tolentino, V. Langlais, E. Bontempi, M. García-Fernández, U. Staub

Department of Physics

Research output: Contribution to journal › Article › Research › peer-review

39 Citations (Scopus)

Abstract

The magnetic profile across the interface of a perpendicular exchange coupled [NiO/CoO]3/Pt-Co/Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign. © 2008 The American Physical Society.

Original language	English
Article number	157202
Journal	Physical Review Letters
Volume	100
Issue number	15
DOIs	https://doi.org/10.1103/PhysRevLett.100.157202
Publication status	Published - 16 Apr 2008

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10.1103/PhysRevLett.100.157202

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title = "Depth magnetization profile of a perpendicular exchange coupled system by soft-X-ray resonant magnetic reflectivity",

abstract = "The magnetic profile across the interface of a perpendicular exchange coupled [NiO/CoO]3/Pt-Co/Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign. {\textcopyright} 2008 The American Physical Society.",

author = "Tonnerre, {J. M.} and {De Santis}, M. and S. Grenier and Tolentino, {H. C.N.} and V. Langlais and E. Bontempi and M. Garc{\'i}a-Fern{\'a}ndez and U. Staub",

year = "2008",

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doi = "10.1103/PhysRevLett.100.157202",

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Depth magnetization profile of a perpendicular exchange coupled system by soft-X-ray resonant magnetic reflectivity. / Tonnerre, J. M.; De Santis, M.; Grenier, S.; Tolentino, H. C.N.; Langlais, V.; Bontempi, E.; García-Fernández, M.; Staub, U.

In: Physical Review Letters, Vol. 100, No. 15, 157202, 16.04.2008.

Research output: Contribution to journal › Article › Research › peer-review

TY - JOUR

T1 - Depth magnetization profile of a perpendicular exchange coupled system by soft-X-ray resonant magnetic reflectivity

AU - Tonnerre, J. M.

AU - De Santis, M.

AU - Grenier, S.

AU - Tolentino, H. C.N.

AU - Langlais, V.

AU - Bontempi, E.

AU - García-Fernández, M.

AU - Staub, U.

PY - 2008/4/16

Y1 - 2008/4/16

N2 - The magnetic profile across the interface of a perpendicular exchange coupled [NiO/CoO]3/Pt-Co/Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign. © 2008 The American Physical Society.

AB - The magnetic profile across the interface of a perpendicular exchange coupled [NiO/CoO]3/Pt-Co/Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign. © 2008 The American Physical Society.

U2 - 10.1103/PhysRevLett.100.157202

DO - 10.1103/PhysRevLett.100.157202

M3 - Article

VL - 100

IS - 15

M1 - 157202

ER -

Depth magnetization profile of a perpendicular exchange coupled system by soft-X-ray resonant magnetic reflectivity

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