We describe the deposition and characterization of epitaxial thin films of the iron oxide haematite (α-Fe2O3), a promising candidate for fundamental studies of exchange anisotropy as well as for high thermal stability applications. The films were deposited by reactive dc magnetron sputtering. Structural characterization was by large-angle X-ray diffraction and grazing-incidence reflectivity (with the scattering vector normal to the sample plane), in-plane grazing-incidence diffraction (scattering vector in the sample plane) and reflection high-energy electron diffraction. Optimized sputtering conditions result in good epitaxy both in the growth direction and in the plane, as well as very smooth surfaces.
|Journal||Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties|
|Publication status||Published - 1 Dec 2001|