Dependence of MOSFETs threshold voltage variability on channel dimensions

C. Couso, J. Diaz-Fortuny, J. Martin-Martinez, M. Porti, R. Rodriguez, M. Nafria, F. V. Fernandez, E. Roca, R. Castro-Lopez, E. Barajas, D. Mateo, X. Aragones

Research output: Chapter in BookChapterResearchpeer-review

Original languageUndefined/Unknown
Title of host publication2017 Joint International Eurosoi Workshop and International Conference on Ultimate Integration on Silicon (Eurosoi-Ulis 2017)
Publication statusPublished - 2017

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