Degradation dynamics and breakdown of MgO gate oxides

E. Miranda, E. O'Connor, G. Hughes, P. Casey, K. Cherkaoui, S. Monaghan, R. Long, D. O'Connell, P.K. Hurley

Research output: Contribution to journalArticleResearch

9 Citations (Scopus)
Original languageEnglish
Pages (from-to)---
JournalMicroelectronic Engineering
Publication statusPublished - 1 Jan 2009

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