Original language | English |
---|---|
Pages (from-to) | 368-370 |
Journal | Electronic Letter |
Volume | 46 |
Issue number | 6 |
Publication status | Published - 1 Jan 2005 |
DC BD MOSFET model for circuit reliability simulation
R. Fernandez, R. Rodriguez, M. Nafria, X. Aymerich
Research output: Contribution to journal › Article › Research
58
Citations
(Scopus)