Détection de fautes basée en graphs pour circuits intégrés NMOS

Research output: Chapter in BookChapterResearch

Original languageFrench
Title of host publicationISMM Intenational Symposium on Mini and Microcomputers and their applications (MIMI'87)
Place of PublicationAnaheim (US)
Pages129-132
Number of pages3
Edition1
Publication statusPublished - 1 Jan 1987

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