Critical-current density of melt-grown single-grain Y-Ba-Cu-O disks determined by ac susceptibility measurements

D. X. Chen, A. Sanchez, C. Navau, Y. H. Shi, D. A. Cardwell

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15 Citations (Scopus)

Abstract

The field amplitude and frequency dependent complex ac susceptibility χ(Hm,f) of three Y-Ba-Cu-O disks made by a top-seeded melt growth technique has been measured at 77 K with the ac field applied along the c-axis of the samples (parallel to their thickness). A procedure based on the Bean model has been developed to calculate the critical-current density Jc near the surface of the sample from the measured χ(Hm) for the case where the maximum imaginary component χ′′ is not reached. © 2008 IOP Publishing Ltd.
Original languageEnglish
Article number085013
JournalSuperconductor Science and Technology
Volume21
Issue number8
DOIs
Publication statusPublished - 1 Aug 2008

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