TY - JOUR
T1 - Conical refraction as a tool for polarization metrology
AU - Peinado, Alba
AU - Turpin, Alex
AU - Lizana, Angel
AU - Fernández, Estefania
AU - Mompart, Jordi
AU - Campos, Juan
PY - 2013/10/15
Y1 - 2013/10/15
N2 - A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. We present the design of a division-of-amplitude complete polarimeter composed of two biaxial crystals, whose measurement principle is based on the CR phenomenon. This design corresponds to a static polarimeter, that is, without mechanical movements or electrical signal addressing. Only one division-of-amplitude device is required, besides the two biaxial crystals, to completely characterize any state of polarization, including partially polarized and unpolarized states. In addition, a mathematical model describing the system is included. Experimental images of the intensity distribution related to different input polarization states are provided. These intensity patterns are compared with simulated values, proving the potential of polarimeters based on biaxial crystals. © 2013 Optical Society of America.
AB - A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. We present the design of a division-of-amplitude complete polarimeter composed of two biaxial crystals, whose measurement principle is based on the CR phenomenon. This design corresponds to a static polarimeter, that is, without mechanical movements or electrical signal addressing. Only one division-of-amplitude device is required, besides the two biaxial crystals, to completely characterize any state of polarization, including partially polarized and unpolarized states. In addition, a mathematical model describing the system is included. Experimental images of the intensity distribution related to different input polarization states are provided. These intensity patterns are compared with simulated values, proving the potential of polarimeters based on biaxial crystals. © 2013 Optical Society of America.
U2 - https://doi.org/10.1364/OL.38.004100
DO - https://doi.org/10.1364/OL.38.004100
M3 - Article
VL - 38
SP - 4100
EP - 4103
JO - Optics Letters
JF - Optics Letters
SN - 0146-9592
ER -