Conical refraction as a tool for polarization metrology

Alba Peinado; Alex Turpin; Angel Lizana; Estefania Fernández; Jordi Mompart; Juan Campos

doi:https://doi.org/10.1364/OL.38.004100

Conical refraction as a tool for polarization metrology

Alba Peinado, Alex Turpin, Angel Lizana, Estefania Fernández, Jordi Mompart, Juan Campos

Research output: Contribution to journal › Article › Research › peer-review

34 Citations (Scopus)

Abstract

A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. We present the design of a division-of-amplitude complete polarimeter composed of two biaxial crystals, whose measurement principle is based on the CR phenomenon. This design corresponds to a static polarimeter, that is, without mechanical movements or electrical signal addressing. Only one division-of-amplitude device is required, besides the two biaxial crystals, to completely characterize any state of polarization, including partially polarized and unpolarized states. In addition, a mathematical model describing the system is included. Experimental images of the intensity distribution related to different input polarization states are provided. These intensity patterns are compared with simulated values, proving the potential of polarimeters based on biaxial crystals. © 2013 Optical Society of America.

Original language	English
Pages (from-to)	4100-4103
Journal	Optics Letters
Volume	38
DOIs	https://doi.org/10.1364/OL.38.004100
Publication status	Published - 15 Oct 2013

Access to Document

https://doi.org/10.1364/OL.38.004100

Fingerprint Dive into the research topics of 'Conical refraction as a tool for polarization metrology'. Together they form a unique fingerprint.

Cite this

@article{5a1691467afe486c96811b053a8ff257,

title = "Conical refraction as a tool for polarization metrology",

abstract = "A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. We present the design of a division-of-amplitude complete polarimeter composed of two biaxial crystals, whose measurement principle is based on the CR phenomenon. This design corresponds to a static polarimeter, that is, without mechanical movements or electrical signal addressing. Only one division-of-amplitude device is required, besides the two biaxial crystals, to completely characterize any state of polarization, including partially polarized and unpolarized states. In addition, a mathematical model describing the system is included. Experimental images of the intensity distribution related to different input polarization states are provided. These intensity patterns are compared with simulated values, proving the potential of polarimeters based on biaxial crystals. {\textcopyright} 2013 Optical Society of America.",

author = "Alba Peinado and Alex Turpin and Angel Lizana and Estefania Fern{\'a}ndez and Jordi Mompart and Juan Campos",

year = "2013",

month = oct,

day = "15",

doi = "https://doi.org/10.1364/OL.38.004100",

language = "English",

volume = "38",

pages = "4100--4103",

journal = "Optics Letters",

issn = "0146-9592",

publisher = "The Optical Society",

}

TY - JOUR

T1 - Conical refraction as a tool for polarization metrology

AU - Peinado, Alba

AU - Turpin, Alex

AU - Lizana, Angel

AU - Fernández, Estefania

AU - Mompart, Jordi

AU - Campos, Juan

PY - 2013/10/15

Y1 - 2013/10/15

N2 - A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. We present the design of a division-of-amplitude complete polarimeter composed of two biaxial crystals, whose measurement principle is based on the CR phenomenon. This design corresponds to a static polarimeter, that is, without mechanical movements or electrical signal addressing. Only one division-of-amplitude device is required, besides the two biaxial crystals, to completely characterize any state of polarization, including partially polarized and unpolarized states. In addition, a mathematical model describing the system is included. Experimental images of the intensity distribution related to different input polarization states are provided. These intensity patterns are compared with simulated values, proving the potential of polarimeters based on biaxial crystals. © 2013 Optical Society of America.

AB - A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. We present the design of a division-of-amplitude complete polarimeter composed of two biaxial crystals, whose measurement principle is based on the CR phenomenon. This design corresponds to a static polarimeter, that is, without mechanical movements or electrical signal addressing. Only one division-of-amplitude device is required, besides the two biaxial crystals, to completely characterize any state of polarization, including partially polarized and unpolarized states. In addition, a mathematical model describing the system is included. Experimental images of the intensity distribution related to different input polarization states are provided. These intensity patterns are compared with simulated values, proving the potential of polarimeters based on biaxial crystals. © 2013 Optical Society of America.

U2 - https://doi.org/10.1364/OL.38.004100

DO - https://doi.org/10.1364/OL.38.004100

M3 - Article

VL - 38

SP - 4100

EP - 4103

JO - Optics Letters

JF - Optics Letters

SN - 0146-9592

ER -