Conductance of Threading Dislocations in InGaAs/Si Stacks by Temperature-CAFM Measurements

C. Couso, V. Iglesias, M. Porti, S. Claramunt, M. Nafría, N. Domingo, A. Cordes, G. Bersuker

Research output: Contribution to journalArticleResearchpeer-review

9 Citations (Scopus)

Fingerprint Dive into the research topics of 'Conductance of Threading Dislocations in InGaAs/Si Stacks by Temperature-CAFM Measurements'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science