Charecterization of the metal-SiO\sub \nosub Si interface Roughness by Electrical Methods

J. Suñé, I. Placencia, F. Campabadal, X Aymerich

Research output: Contribution to journalArticleResearch

11 Citations (Scopus)
Original languageEnglish
Pages (from-to)346-352
JournalSurface Science
Volume189
Issue number189
Publication statusPublished - 1 Jan 1987

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