Charecterization of the metal-SiO\sub \nosub Si interface Roughness by Electrical Methods

J. Suñé, I. Placencia, F. Campabadal, X Aymerich

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Cite this

@article{c2f5b95736d248b38810697553e8a38e,

title = "Charecterization of the metal-SiO\sub \nosub Si interface Roughness by Electrical Methods",

author = "J. Su{\~n}{\'e} and I. Placencia and F. Campabadal and X Aymerich",

year = "1987",

month = jan,

day = "1",

language = "English",

volume = "189",

pages = "346--352",

journal = "Surface Science",

issn = "0039-6028",

number = "189",

}