Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopy

Xavier Borrisé, David Jiménez, Francesc Pérez-Murano, Andreu Llobera, Carlos Domínguez, Núria Barniol

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    Abstract

    Silicon-based antiresonant reflecting optical waveguide (ARROW) devices were studied by means of a scanning near-field optical microscope. Various structures such as a Y junction of a Mach–Zehnder interferometer and a directional optical coupler were characterized, showing the propagation of the light inside the devices simultaneously with the topography. Scattering on the splitting point of the Y junction was shown, as well as a partial coupling of the light between the two branches of the coupler. Measurements on the decay length of the evanescent field were also performed to study the use of the ARROW waveguide for sensor purposes. © 2000 Optical Society of America.
    Original languageEnglish
    Pages (from-to)2243-2248
    JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
    Volume17
    DOIs
    Publication statusPublished - 1 Jan 2000

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