Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks

Esteve Amat, Thomas Kauerauf, Robin Degraeve, An De Keersgieter, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Guido Groeseneken

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40 Citations (Scopus)

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Chemical Compounds

Engineering & Materials Science