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Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack
E. Amat, T. Kauerauf, R. Degraeve, R. Rodríguez, M. Nafría, X. Aymerich, G. Groeseneken
Research output: Contribution to journal › Article › Research › peer-review
36
Citations
(Scopus)