Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack

E. Amat, T. Kauerauf, R. Degraeve, R. Rodríguez, M. Nafría, X. Aymerich, G. Groeseneken

Research output: Contribution to journalArticleResearchpeer-review

30 Citations (Scopus)

Fingerprint Dive into the research topics of 'Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack'. Together they form a unique fingerprint.

Physics & Astronomy