Channel-hot-carrier degradation and bias temperature instabilities in CMOS inverters

Javier Martín-Martínez, Simone Gerardin, Esteve Amat, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Alessandro Paccagnella, Gabriella Ghidini

Research output: Contribution to journalArticleResearchpeer-review

22 Citations (Scopus)

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Material Science

Engineering