Original language | English |
---|---|
Pages (from-to) | 599-602 |
Journal | Microelectronic Engineering |
Volume | 98 |
DOIs | |
Publication status | Published - 1 Jan 2012 |
Cancellation of the Parasitic Feedthrough Current in an Integrated CMOS-MEMS Clamped- Clamped Beam Resonator
Research output: Contribution to journal › Article › Research
6
Citations
(Scopus)