Skip to main navigation Skip to search Skip to main content

Breakdown of thin gate silicon dioxide films - A review

M. Nafría, J. Suñé, X. Aymerich

    Research output: Contribution to journalArticleResearchpeer-review

    Fingerprint

    Dive into the research topics of 'Breakdown of thin gate silicon dioxide films - A review'. Together they form a unique fingerprint.
    Sort by

    Keyphrases

    Engineering

    Physics