Original language | English |
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Title of host publication | OXIDE RELIABILITY A Summary of Silicon Oxide Wearout, Breakdown, and Reliability |
Place of Publication | Al Isma'iliyah (US) |
Pages | 173-232 |
Number of pages | 59 |
Volume | 23 |
Edition | 1 |
Publication status | Published - 1 Jan 2002 |
Breakdown Modes and Breakdown Statistics of Ultrathin SiO2 Gate Oxides
J. Suñé, D. Jiménez, E. Miranda, D J Dumin (Editor)
Research output: Chapter in Book › Chapter › Research