Breakdown modes and breakdown statistics of SiO2 gate oxides

J Suñé, D Jiménez, Miranda, E.

    Research output: Contribution to journalReview articleResearch

    Original languageEnglish
    Pages (from-to)789-848
    JournalInternational Journal of High Speed Electronics and Systems
    Volume11
    Issue number3
    DOIs
    Publication statusPublished - 1 Jan 2001

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