Breakdown-induced negative charge in ultrathin SiO<inf>2</inf> films measured by atomic force microscopy

M. Porti, M. Nafría, M. C. Blüm, X. Aymerich, S. Sadewasser

    Research output: Contribution to journalArticleResearchpeer-review

    29 Citations (Scopus)

    Abstract

    Atomic-force-microscopy-based techniques have been used to investigate at a nanometer scale the dielectric breakdown (BD) of ultrathin (<6 nm) SiO 2 films of metal-oxide-semiconductor devices. The results show that BD leads to negative charge at the BD location and the amount of created charge has been estimated. Moreover, the comparison of the charge magnitude generated during current-limited stresses and stresses without current limit demonstrates that the observed BD induced negative charge is related to the structural damage created by the oxide BD. © 2002 American Institute of Physics.
    Original languageEnglish
    Pages (from-to)3615-3617
    JournalApplied Physics Letters
    Volume81
    DOIs
    Publication statusPublished - 4 Nov 2002

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