Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics. "Switching events in the soft breakdown I-t characteristic of ultrathin SiO2 layers". The 9th Workshop Dielectrics in Microelectronics.

E. Miranda, R. Rodríguez, M. Nafría, J. Suñé, X. Aymerich, d'Analyse et d'Architecture des Systèmes (LAAS-CNRS) Laboratoire (Editor)

    Research output: Book/ReportProceedingResearch

    Original languageUndefined/Unknown
    Place of PublicationToulouse. (FR)
    Number of pages1
    Publication statusPublished - Jun 1998

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