Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics. "Two-step stress tests for the assessment of the dynamic reliabiilty of very thin (8nm) SiO2 films".: Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics.

R. Rodríguez; E. Miranda; M. Nafría; J. Suñé; X. Aymerich; d'Analyse et d'Architecture des Systèmes (LAAS-CNRS) Laboratore

Book of Abstracts of the 9^th Workshop Dielectrics in Microelectronics. "Two-step stress tests for the assessment of the dynamic reliabiilty of very thin (8nm) SiO2 films". Book of Abstracts of the 9^th Workshop Dielectrics in Microelectronics.

R. Rodríguez, E. Miranda, M. Nafría, J. Suñé, X. Aymerich, d'Analyse et d'Architecture des Systèmes (LAAS-CNRS) Laboratore (Editor)

Research output: Book/Report › Proceeding › Research

Original language	Undefined/Unknown
Place of Publication	Toulouse. (FR)
Number of pages	0
Publication status	Published - Jun 1998

Cite this

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title = "Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics. {"}Two-step stress tests for the assessment of the dynamic reliabiilty of very thin (8nm) SiO2 films{"}.: Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics.",

author = "R. Rodr{\'i}guez and E. Miranda and M. Nafr{\'i}a and J. Su{\~n}{\'e} and X. Aymerich",

editor = "Laboratore, {d'Analyse et d'Architecture des Syst{\`e}mes (LAAS-CNRS)}",

year = "1998",

month = jun,

language = "Indefinido/desconocido",

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Book of Abstracts of the 9^th Workshop Dielectrics in Microelectronics. "Two-step stress tests for the assessment of the dynamic reliabiilty of very thin (8nm) SiO2 films". Book of Abstracts of the 9^th Workshop Dielectrics in Microelectronics. / Rodríguez, R.; Miranda, E.; Nafría, M. et al.

Toulouse. (FR), 1998.

Research output: Book/Report › Proceeding › Research

TY - BOOK

T1 - Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics. "Two-step stress tests for the assessment of the dynamic reliabiilty of very thin (8nm) SiO2 films".

T2 - Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics.

AU - Rodríguez, R.

AU - Miranda, E.

AU - Nafría, M.

AU - Suñé, J.

AU - Aymerich, X.

A2 - Laboratore, d'Analyse et d'Architecture des Systèmes (LAAS-CNRS)

PY - 1998/6

Y1 - 1998/6

M3 - Libro de Actas

BT - Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics. "Two-step stress tests for the assessment of the dynamic reliabiilty of very thin (8nm) SiO2 films".

CY - Toulouse. (FR)

ER -

Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics. "Two-step stress tests for the assessment of the dynamic reliabiilty of very thin (8nm) SiO2 films". Book of Abstracts of the 9th Workshop Dielectrics in Microelectronics.

Cite this

Book of Abstracts of the 9^th Workshop Dielectrics in Microelectronics. "Two-step stress tests for the assessment of the dynamic reliabiilty of very thin (8nm) SiO2 films". Book of Abstracts of the 9^th Workshop Dielectrics in Microelectronics.