Automatic Test Pattern Generation for IDDQ Faults based upon Symbolic Simulation

L. Ribas, J. Carrabina

    Research output: Chapter in BookChapterResearch

    Original languageEnglish
    Title of host publicationIEEE International Workshop on IDDQ Testing
    Place of PublicationLos Alamitos (US)
    Pages94-101
    Number of pages7
    Edition1
    Publication statusPublished - 1 Jan 1996

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