A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. © 1993.
|Journal||Microprocessing and Microprogramming|
|Publication status||Published - 1 Jan 1993|