Automatic pattern generation for the electrical characterization of digital modules

Ll Ribas; J. Riera; J. M. Pérez; J. Saiz; J. Carrabina; Ll Terés

doi:https://doi.org/10.1016/0165-6074(93)90100-Y

Automatic pattern generation for the electrical characterization of digital modules

Ll Ribas, J. Riera, J. M. Pérez, J. Saiz, J. Carrabina, Ll Terés

Research output: Contribution to journal › Article › Research › peer-review

Abstract

A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. © 1993.

Original language	English
Pages (from-to)	255-258
Journal	Microprocessing and Microprogramming
Volume	39
DOIs	https://doi.org/10.1016/0165-6074(93)90100-Y
Publication status	Published - 1 Jan 1993

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title = "Automatic pattern generation for the electrical characterization of digital modules",

abstract = "A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. {\textcopyright} 1993.",

author = "Ll Ribas and J. Riera and P{\'e}rez, {J. M.} and J. Saiz and J. Carrabina and Ll Ter{\'e}s",

year = "1993",

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AU - Riera, J.

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AU - Saiz, J.

AU - Carrabina, J.

AU - Terés, Ll

PY - 1993/1/1

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AB - A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. © 1993.

U2 - https://doi.org/10.1016/0165-6074(93)90100-Y

DO - https://doi.org/10.1016/0165-6074(93)90100-Y

M3 - Article

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EP - 258

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