Abstract
A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. © 1993.
Original language | English |
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Pages (from-to) | 255-258 |
Journal | Microprocessing and Microprogramming |
Volume | 39 |
DOIs | |
Publication status | Published - 1 Jan 1993 |