Original language | Undefined/Unknown |
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Place of Publication | - (GB) |
Number of pages | 4 |
Publication status | Published - Jul 1997 |
Analysis of the evolution of the trapped charge distributions in 10 nm SiO2 films during DC and bipolar dynamic stress. Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97)
R Rodriguez, M Nafría, J Suñé, X Aymerich, N Labat (Editor), A Touboul (Editor)
Research output: Book/Report › Proceeding › Research