Analysis of IDDQ and ISSQ Testing Implementation and Circuit Partitioning.

M. Rullán, C. Ferrer, D. Mateo, J. Oliver, A. Rubio, ISBN: 0-8186-7423-7 ISSN: 1066-1409 (Editor)

    Research output: Chapter in BookChapterResearch

    Original languageEnglish
    Title of host publicationIEEE European Design and Test Conference'96
    Place of PublicationParís (FR)
    Number of pages4
    Publication statusPublished - 1 Jan 1996

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