Analog and digital circuit functionality under the influence of gate oxide degradation and breakdown

R. Rodríguez, R. Fernández, M. Nafría, X. Aymerich, Lucas M. Simon Noah T. Andre (Editor), Javier Martin Martinez

Research output: Chapter in BookChapterResearch

Original languageEnglish
Title of host publicationMOSFETs: Properties, Preparations and Performance
Place of PublicationLondres (GB)
Number of pages18
Publication statusPublished - 1 Jan 2008

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