Original language | English |
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Title of host publication | MOSFETs: Properties, Preparations and Performance |
Place of Publication | Londres (GB) |
Pages | 401-419 |
Number of pages | 18 |
Edition | 1 |
Publication status | Published - 1 Jan 2008 |
Analog and digital circuit functionality under the influence of gate oxide degradation and breakdown
R. Rodríguez, R. Fernández, M. Nafría, X. Aymerich, Lucas M. Simon Noah T. Andre (Editor), Javier Martin Martinez
Research output: Chapter in Book › Chapter › Research