An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks

P. Martin-Lloret, J. Nuñez, E. Roca, R. Castro-Lopez, J. Martin-Martinez, R. Rodriguez, M. Nafria, F. V. Fernandez

Research output: Book/ReportProceedingResearchpeer-review

4 Citations (Scopus)


This paper presents an integrated circuit (IC) array whose purpose is to observe, quantify and characterize the impact of time-dependent variability effects, like aging, in several widely used digital and analog circuit blocks. With the increasing interest that this kind of mechanism has attracted in the last years, for its potential impact in the reliability of ultra-scaled integrated circuits, it is only relevant that appropriate measures are taken to find out how it can be included (and thus mitigated) in the design process of such integrated circuits. And, while substantial literature exists that covers the device level, time-dependent variability at circuit level has not been as equally studied. This work complements our previous efforts in providing a holistic approach to Reliability-Aware Design: from statistical characterization and modeling at device-level, to simulation, and into optimization-based design with reliability considerations, the array presented here provides one more step towards a thorough and accurate understanding of how time-dependent variability works at the circuit level.

Original languageEnglish
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages4
ISBN (Electronic)9781728112015
Publication statusPublished - Jul 2019

Publication series

NameSMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Proceedings


  • Aging
  • Analog Circuits
  • Bias Temperature Instability
  • Hot Carrier Injection
  • Random Telegraph Noise
  • Time-Dependent Variability


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