An examination of microtexture and microstructure in ultrafine-grained nickel

A. P. Zhilyaev, M. D. Baró, T. G. Langdon, T. R. McNelley

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19 Citations (Scopus)


A detailed orientation imaging microscopy (OIM) investigation was conducted to evaluate the microstructural characteristics in samples of pure nickel processed using three different procedures of severe plastic deformation (SPD): equal-channel angular pressing (ECAP), high-pressure torsion (HPT) and a combination of ECAP and HPT. Electron backscattering diffraction (EBSD) techniques were employed to measure the microtextures and the distributions of the misorientation angles. A thorough analysis of the microtexture revealed the shear plane normal and shear direction for UFG nickel obtained by various kinds of severe plastic deformation. It is shown that a combination of ECAP and HPT leads both to a greater refinement in the microstructure and to a smaller fraction of boundaries having low angles of misorientation. © 2004 Advanced Study Center Co. Ltd.
Original languageEnglish
Pages (from-to)41-49
JournalReviews on Advanced Materials Science
Issue number1
Publication statusPublished - 1 Jul 2004


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