An electron injection model for time-dependent simulators of nanoscale devices with electron confinement: Application to the comparison of the intrinsic noise of 3D-, 2D- and 1D-ballistic transistors

X. Oriols, E. Fernàndez-Díaz, A. Alvarez, A. Alarcón

Research output: Contribution to journal › Article › Research › peer-review

22 Citations (Scopus)

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