An Approach to the developpement of a Iddq testable cell library

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Original language	English
Title of host publication	Proceedings del International Workshop on Defect and Fault Tolerance in VLSI Systems
Place of Publication	Los Alamitos (US)
Pages	46-54
Number of pages	8
Edition	1
Publication status	Published - 1 Jan 1994

Cite this

@inbook{3f193e671fda4c50a68ceedcd72f2eff,

title = "An Approach to the developpement of a Iddq testable cell library",

author = "C. Ferrer and D. Mateo and J. Oliver and A. Rubio and M. Rullan",

year = "1994",

month = jan,

day = "1",

language = "English",

isbn = "0-8186-6307-3",

pages = "46--54",

booktitle = "Proceedings del International Workshop on Defect and Fault Tolerance in VLSI Systems",

edition = "1",

}