An Approach to the developpement of a Iddq testable cell library

C. Ferrer, D. Mateo, J. Oliver, A. Rubio, M. Rullan

    Research output: Chapter in BookChapterResearch

    Original languageEnglish
    Title of host publicationProceedings del International Workshop on Defect and Fault Tolerance in VLSI Systems
    Place of PublicationLos Alamitos (US)
    Number of pages8
    Publication statusPublished - 1 Jan 1994

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