Alternating-current susceptibility and critical-current density of melt-processed Gd-Ba-Cu-O-Ag single grains: Effect of intrinsic edge pinning

D. X. Chen, Y. H. Shi, C. Navau, A. Sanchez, D. A. Cardwell

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3 Citations (Scopus)

Abstract

The field amplitude dependent complex ac susceptibility χ(H m) of disc and square-planar samples cut from a Gd-Ba-Cu-O-Ag single grain fabricated by top-seeded melt growth (TSMG) has been measured at 77K with the ac field applied along the crystallographic c axis of the single grain. The critical-current density J c has been extracted from the measured χ(H m) data based on the critical-state model assuming constant J c. It is shown that J c increases continuously with decreasing H m, which is attributed to strong intrinsic pinning occurring at the edges of the sample.
Original languageEnglish
Article number014010
JournalSuperconductor Science and Technology
Volume25
DOIs
Publication statusPublished - 1 Jan 2012

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