All-inkjet printed organic transistors: dielectric surface passivation techniques for improved operational stability and lifetime

Henrique L. Gomes; Maria C Raposo de Medeiros; Fulvia Villani; Joana Canudo; Fausta Loffredo; Ricardo Miscioscia; Carme Martinez-Domingo; Eloi Ramon; Enrico Sowade; Reinhard R Baumann; Ian McCulloch; Jordi Carrabina

All-inkjet printed organic transistors: dielectric surface passivation techniques for improved operational stability and lifetime

Henrique L. Gomes, Maria C Raposo de Medeiros, Fulvia Villani, Joana Canudo, Fausta Loffredo, Ricardo Miscioscia, Carme Martinez-Domingo, Eloi Ramon, Enrico Sowade, Reinhard R Baumann, Ian McCulloch, Jordi Carrabina

Research output: Contribution to journal › Article › Research

25 Citations (Scopus)

Original language	English
Pages (from-to)	-
Journal	Microelectronics Reliability
Publication status	Published - 1 Jan 2015

Cite this

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title = "All-inkjet printed organic transistors: dielectric surface passivation techniques for improved operational stability and lifetime",

author = "Gomes, {Henrique L.} and Medeiros, {Maria C Raposo de} and Fulvia Villani and Joana Canudo and Fausta Loffredo and Ricardo Miscioscia and Carme Martinez-Domingo and Eloi Ramon and Enrico Sowade and Baumann, {Reinhard R} and Ian McCulloch and Jordi Carrabina",

year = "2015",

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language = "English",

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journal = "Microelectronics Reliability",

issn = "0026-2714",

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TY - JOUR

T1 - All-inkjet printed organic transistors: dielectric surface passivation techniques for improved operational stability and lifetime

AU - Gomes, Henrique L.

AU - Medeiros, Maria C Raposo de

AU - Villani, Fulvia

AU - Canudo, Joana

AU - Loffredo, Fausta

AU - Miscioscia, Ricardo

AU - Martinez-Domingo, Carme

AU - Ramon, Eloi

AU - Sowade, Enrico

AU - Baumann, Reinhard R

AU - McCulloch, Ian

AU - Carrabina, Jordi

PY - 2015/1/1

Y1 - 2015/1/1

M3 - Article

SN - 0026-2714

SP - -

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -