Aging in CMOS RF Linear Power Amplifiers: An Experimental Study

Xavier Aragones; Enrique Barajas; Albert Crespo-Yepes; Diego Mateo; Rosana Rodriguez; Montserrat Nafria Maqueda; Javier Martin-Martinez

doi:10.1109/TMTT.2020.3041282

Aging in CMOS RF Linear Power Amplifiers: An Experimental Study

Xavier Aragones, Enrique Barajas, Albert Crespo-Yepes, Diego Mateo, Rosana Rodriguez, Montserrat Nafria Maqueda, Javier Martin-Martinez

Department of Electronic Engineering

Research output: Contribution to journal › Article › Research › peer-review

1 Citation (Scopus)

Original language	English
Journal	IEEE Transactions on Microwave Theory and Techniques
DOIs	https://doi.org/10.1109/TMTT.2020.3041282
Publication status	Published - Feb 2021

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10.1109/TMTT.2020.3041282

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title = "Aging in CMOS RF Linear Power Amplifiers: An Experimental Study",

author = "Xavier Aragones and Enrique Barajas and Albert Crespo-Yepes and Diego Mateo and Rosana Rodriguez and {Nafria Maqueda}, Montserrat and Javier Martin-Martinez",

year = "2021",

month = feb,

doi = "10.1109/TMTT.2020.3041282",

language = "English",

journal = "IEEE Transactions on Microwave Theory and Techniques",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

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AU - Aragones, Xavier

AU - Barajas, Enrique

AU - Crespo-Yepes, Albert

AU - Mateo, Diego

AU - Rodriguez, Rosana

AU - Nafria Maqueda, Montserrat

AU - Martin-Martinez, Javier

PY - 2021/2

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U2 - 10.1109/TMTT.2020.3041282

DO - 10.1109/TMTT.2020.3041282

M3 - Article

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

ER -

Aging in CMOS RF Linear Power Amplifiers: An Experimental Study

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