After-breakdown conduction through ultrathin SiO\sub 2\nosub films in metal-insulator-semiconductor structures

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@article{fa1c7da6e58e4516ba569303da0875aa,

title = "After-breakdown conduction through ultrathin SiO\sub 2\nosub films in metal-insulator-semiconductor structures",

author = "J. Su{\~n}{\'e} and E. Farr{\'e}s and X. Aymerich",

year = "1991",

month = jan,

day = "1",

language = "English",

volume = "196",

pages = "11--27",

journal = "Thin Solid Films",

issn = "0040-6090",

}