After-breakdown conduction through ultrathin SiO\sub 2\nosub films in metal-insulator-semiconductor structures

J. Suñé, E. Farrés, X. Aymerich

Research output: Contribution to journalArticleResearch

7 Citations (Scopus)
Original languageEnglish
Pages (from-to)11-27
JournalThin Solid Films
Volume196
Publication statusPublished - 1 Jan 1991

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