Advanced Measurement Techniques for the Characterization of ReRAM Devices

M. Nafria, R. Rodriguez, M. Porti, J. Martin-Martinez, A. Crespo-Yepes, S. Claramunt, X. Aymerich

Research output: Chapter in BookChapterResearchpeer-review

Original languageUndefined/Unknown
Title of host publication2017 International Conference on Semiconductor Technology For Ultra Large Scale Integrated Circuits and Thin Film Transistors (Ulsic Vs. Tft 6)
DOIs
Publication statusPublished - 2017

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