Original language | Undefined/Unknown |
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Title of host publication | 2017 International Conference on Semiconductor Technology For Ultra Large Scale Integrated Circuits and Thin Film Transistors (Ulsic Vs. Tft 6) |
DOIs | |
Publication status | Published - 2017 |
Advanced Measurement Techniques for the Characterization of ReRAM Devices
M. Nafria, R. Rodriguez, M. Porti, J. Martin-Martinez, A. Crespo-Yepes, S. Claramunt, X. Aymerich
Research output: Chapter in Book › Chapter › Research › peer-review