Advanced Measurement Techniques for the Characterization of ReRAM Devices

M. Nafria; R. Rodriguez; M. Porti; J. Martin-Martinez; A. Crespo-Yepes; S. Claramunt; X. Aymerich

doi:10.1149/07901.0139ecst

Advanced Measurement Techniques for the Characterization of ReRAM Devices

M. Nafria, R. Rodriguez, M. Porti, J. Martin-Martinez, A. Crespo-Yepes, S. Claramunt, X. Aymerich

Department of Electronic Engineering

Research output: Chapter in Book › Chapter › Research › peer-review

Original language	Undefined/Unknown
Title of host publication	2017 International Conference on Semiconductor Technology For Ultra Large Scale Integrated Circuits and Thin Film Transistors (Ulsic Vs. Tft 6)
DOIs	https://doi.org/10.1149/07901.0139ecst
Publication status	Published - 2017

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Nafria, M., Rodriguez, R., Porti, M., Martin-Martinez, J., Crespo-Yepes, A., Claramunt, S., & Aymerich, X. (2017). Advanced Measurement Techniques for the Characterization of ReRAM Devices. In 2017 International Conference on Semiconductor Technology For Ultra Large Scale Integrated Circuits and Thin Film Transistors (Ulsic Vs. Tft 6) https://doi.org/10.1149/07901.0139ecst

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AU - Nafria, M.

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AU - Martin-Martinez, J.

AU - Crespo-Yepes, A.

AU - Claramunt, S.

AU - Aymerich, X.

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M3 - Capítulo

BT - 2017 International Conference on Semiconductor Technology For Ultra Large Scale Integrated Circuits and Thin Film Transistors (Ulsic Vs. Tft 6)

ER -

Advanced Measurement Techniques for the Characterization of ReRAM Devices

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