Advanced characterization and analysis of random telegraph noise in CMOS devices

J. Martin-Martinez, R. Rodriguez*, M. Nafria

*Corresponding author for this work

Research output: Chapter in BookChapterResearchpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publicationNoise in Nanoscale Semiconductor Devices
PublisherSpringer International Publishing AG
Pages467-493
Number of pages27
ISBN (Electronic)9783030375003
ISBN (Print)9783030374990
DOIs
Publication statusPublished - 26 Apr 2020

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