AC Susceptibility of a High-Temperature Superconductor Strip: Field-Dependent Power-Law Flux-Creep Model

Du Xing Chen; Shuo Li

doi:10.1109/LMAG.2018.2807782

AC Susceptibility of a High-Temperature Superconductor Strip: Field-Dependent Power-Law Flux-Creep Model

Du Xing Chen, Shuo Li

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1 Citation (Scopus)

Abstract

© 2010-2012 IEEE. The field-amplitude-dependent ac susceptibility χ (Hm) and the voltage-current curve V(I) of rectangular samples cut from the same high-temperature superconductor strip are measured at 77 K. The high-Hm part of χ (Hm) and the high-I part of V(I) can be consistently well simulated by a flux-creep model of power-law dependence of the electric field on a Kim-type magnetic-field-dependent sheet current density. The low-Hm and low-I departure from our experiment results from edge damage due to cutting.

Original language	English
Article number	1102305
Journal	IEEE Magnetics Letters
Volume	9
DOIs	https://doi.org/10.1109/LMAG.2018.2807782
Publication status	Published - 17 Feb 2018

Keywords

Electromagnetics
Kim model
ac susceptibility
demagnetizing correction
power-law E(J) relation
superconductor strip

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10.1109/LMAG.2018.2807782

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@article{115739ffa0044b9588f686c9504cbb4a,

title = "AC Susceptibility of a High-Temperature Superconductor Strip: Field-Dependent Power-Law Flux-Creep Model",

abstract = "{\textcopyright} 2010-2012 IEEE. The field-amplitude-dependent ac susceptibility χ (Hm) and the voltage-current curve V(I) of rectangular samples cut from the same high-temperature superconductor strip are measured at 77 K. The high-Hm part of χ (Hm) and the high-I part of V(I) can be consistently well simulated by a flux-creep model of power-law dependence of the electric field on a Kim-type magnetic-field-dependent sheet current density. The low-Hm and low-I departure from our experiment results from edge damage due to cutting.",

keywords = "Electromagnetics, Kim model, ac susceptibility, demagnetizing correction, power-law E(J) relation, superconductor strip",

author = "Chen, {Du Xing} and Shuo Li",

year = "2018",

month = feb,

day = "17",

doi = "10.1109/LMAG.2018.2807782",

language = "English",

volume = "9",

journal = "IEEE Magnetics Letters",

issn = "1949-307X",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - AC Susceptibility of a High-Temperature Superconductor Strip: Field-Dependent Power-Law Flux-Creep Model

AU - Chen, Du Xing

AU - Li, Shuo

PY - 2018/2/17

Y1 - 2018/2/17

N2 - © 2010-2012 IEEE. The field-amplitude-dependent ac susceptibility χ (Hm) and the voltage-current curve V(I) of rectangular samples cut from the same high-temperature superconductor strip are measured at 77 K. The high-Hm part of χ (Hm) and the high-I part of V(I) can be consistently well simulated by a flux-creep model of power-law dependence of the electric field on a Kim-type magnetic-field-dependent sheet current density. The low-Hm and low-I departure from our experiment results from edge damage due to cutting.

AB - © 2010-2012 IEEE. The field-amplitude-dependent ac susceptibility χ (Hm) and the voltage-current curve V(I) of rectangular samples cut from the same high-temperature superconductor strip are measured at 77 K. The high-Hm part of χ (Hm) and the high-I part of V(I) can be consistently well simulated by a flux-creep model of power-law dependence of the electric field on a Kim-type magnetic-field-dependent sheet current density. The low-Hm and low-I departure from our experiment results from edge damage due to cutting.

KW - Electromagnetics

KW - Kim model

KW - ac susceptibility

KW - demagnetizing correction

KW - power-law E(J) relation

KW - superconductor strip

U2 - 10.1109/LMAG.2018.2807782

DO - 10.1109/LMAG.2018.2807782

M3 - Article

VL - 9

JO - IEEE Magnetics Letters

JF - IEEE Magnetics Letters

SN - 1949-307X

M1 - 1102305

ER -

AC Susceptibility of a High-Temperature Superconductor Strip: Field-Dependent Power-Law Flux-Creep Model

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Keywords

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