Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide".: Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference.

J. Suñé; R. Rodríguez; M. Nafría; X. Aymerich; IEEE Electron Device Society

Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide". Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference.

J. Suñé, R. Rodríguez, M. Nafría, X. Aymerich, IEEE Electron Device Society (Editor)

Research output: Book/Report › Proceeding › Research

Original language	Undefined/Unknown
Place of Publication	San Diego (US)
Number of pages	2
Publication status	Published - Jun 1998

Cite this

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title = "Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference. {"}Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide{"}.: Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference.",

author = "J. Su{\~n}{\'e} and R. Rodr{\'i}guez and M. Nafr{\'i}a and X. Aymerich",

editor = "Society, {IEEE Electron Device}",

year = "1998",

month = jun,

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AU - Suñé, J.

AU - Rodríguez, R.

AU - Nafría, M.

AU - Aymerich, X.

A2 - Society, IEEE Electron Device

PY - 1998/6

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Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide". Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference.

Cite this

Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide". Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference.