TY - JOUR
T1 - A novel contactless technique for thermal field mapping and thermal conductivity determination: Two-Laser Raman Thermometry
AU - Reparaz, J. S.
AU - Chavez-Angel, E.
AU - Wagner, M. R.
AU - Graczykowski, B.
AU - Gomis-Bresco, J.
AU - Alzina, F.
AU - Sotomayor Torres, C. M.
PY - 2014/1/1
Y1 - 2014/1/1
N2 - We present a novel contactless technique for thermal conductivity determination and thermal field mapping based on creating a thermal distribution of phonons using a heating laser, while a second laser probes the local temperature through the spectral position of a Raman active mode. The spatial resolution can be as small as 300 nm, whereas its temperature accuracy is ±2 K. We validate this technique investigating the thermal properties of three free-standing single crystalline Si membranes with thickness of 250, 1000, and 2000 nm. We show that for two-dimensional materials such as free-standing membranes or thin films, and for small temperature gradients, the thermal field decays as T(r) â̂©2014 AIP Publishing LLC.
AB - We present a novel contactless technique for thermal conductivity determination and thermal field mapping based on creating a thermal distribution of phonons using a heating laser, while a second laser probes the local temperature through the spectral position of a Raman active mode. The spatial resolution can be as small as 300 nm, whereas its temperature accuracy is ±2 K. We validate this technique investigating the thermal properties of three free-standing single crystalline Si membranes with thickness of 250, 1000, and 2000 nm. We show that for two-dimensional materials such as free-standing membranes or thin films, and for small temperature gradients, the thermal field decays as T(r) â̂©2014 AIP Publishing LLC.
U2 - https://doi.org/10.1063/1.4867166
DO - https://doi.org/10.1063/1.4867166
M3 - Article
VL - 85
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
SN - 0034-6748
IS - 3
M1 - 034901
ER -