@book{a3c53388ed8a400a8aa243c5fb42aa30,
title = "A noise and RTN-removal smart method for parameters extraction of CMOS aging compact models",
abstract = "This work presents a new method to statistically characterize the emission times and threshold voltage shifts (ΔVth) related to oxide defects in nanometer CMOS transistors during aging tests. The method identifies the Vth drops associated to oxide trap emissions during BTI and HCI aging recovery traces while removing RTN and background noise contributions, to avoid artifacts during data analysis.",
keywords = "aging, BTI, CMOS, defects, extraction, HCI, method, parameters, RTN",
author = "Javier Diaz-Fortuny and Javier Martin-Martinez and Rosana Rodriguez and Montserrat Nafria and Rafael Castro-Lopez and Elisenda Roca and Fernandez, {Francisco V.}",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.",
year = "2018",
month = may,
day = "3",
doi = "10.1109/ULIS.2018.8354740",
language = "English",
series = "2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
}