A new switch-level test pattern generator algorithm based on single path over a graph representation

Research output: Chapter in Book › Chapter › Research

Original language	English
Title of host publication	Proceedings de la European Design Automation Conference
Place of Publication	Los Alamitos (US)
Pages	402-406
Number of pages	4
Edition	1
Publication status	Published - 1 Jan 1990

Cite this

@inbook{0f77b0f532524e4483ecae2a7d08758f,

title = "A new switch-level test pattern generator algorithm based on single path over a graph representation",

author = "C. Ferrer and J. Oliver and E. Valderrama",

year = "1990",

month = jan,

day = "1",

language = "English",

isbn = "0-81-86-2024-2",

pages = "402--406",

booktitle = "Proceedings de la European Design Automation Conference",

edition = "1",

}