A new switch-level test pattern generator algorithm based on single path over a graph representation

C. Ferrer, J. Oliver, E. Valderrama

Research output: Chapter in BookChapterResearch

Original languageEnglish
Title of host publicationProceedings de la European Design Automation Conference
Place of PublicationLos Alamitos (US)
Number of pages4
Publication statusPublished - 1 Jan 1990

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