A new method to perform in situ current voltage curves with an electrochemical scanning tunnelling microscope

G. Abadal; F. Pérez-Murano; N. Barniol; X. Borrisé; X. Aymerich

doi:10.1016/S0304-3991(97)00011-9

A new method to perform in situ current voltage curves with an electrochemical scanning tunnelling microscope

G. Abadal, F. Pérez-Murano, N. Barniol, X. Borrisé, X. Aymerich

Research output: Contribution to journal › Article › Research › peer-review

10 Citations (Scopus)

Abstract

A new method to perform in situ current voltage curves with an electrochemical scanning tunneling microscope under bipotentiostatic control is presented. The method eliminates the effect of (a) high parasitic capacitances that are present when tip and sample are immersed in a liquid and (b) electrochemical currents due to the effect of a polarization out of the usual tip versus electrolyte voltage window. Several applications to the study of silicon surfaces in HF solutions are shown.

Original language	English
Pages (from-to)	133-139
Journal	Ultramicroscopy
Volume	66
Issue number	3-4
DOIs	https://doi.org/10.1016/S0304-3991(97)00011-9
Publication status	Published - 1 Dec 1996

Keywords

Electrochemistry
Instrumentation
Scanning probe microscopy

Access to Document

10.1016/S0304-3991(97)00011-9

Cite this

@article{ac44453a7a434df9800c3e8c0e5151f0,

title = "A new method to perform in situ current voltage curves with an electrochemical scanning tunnelling microscope",

abstract = "A new method to perform in situ current voltage curves with an electrochemical scanning tunneling microscope under bipotentiostatic control is presented. The method eliminates the effect of (a) high parasitic capacitances that are present when tip and sample are immersed in a liquid and (b) electrochemical currents due to the effect of a polarization out of the usual tip versus electrolyte voltage window. Several applications to the study of silicon surfaces in HF solutions are shown.",

keywords = "Electrochemistry, Instrumentation, Scanning probe microscopy",

author = "G. Abadal and F. P{\'e}rez-Murano and N. Barniol and X. Borris{\'e} and X. Aymerich",

year = "1996",

month = dec,

day = "1",

doi = "10.1016/S0304-3991(97)00011-9",

language = "English",

volume = "66",

pages = "133--139",

journal = "Ultramicroscopy",

issn = "0304-3991",

number = "3-4",

}

TY - JOUR

T1 - A new method to perform in situ current voltage curves with an electrochemical scanning tunnelling microscope

AU - Abadal, G.

AU - Pérez-Murano, F.

AU - Barniol, N.

AU - Borrisé, X.

AU - Aymerich, X.

PY - 1996/12/1

Y1 - 1996/12/1

N2 - A new method to perform in situ current voltage curves with an electrochemical scanning tunneling microscope under bipotentiostatic control is presented. The method eliminates the effect of (a) high parasitic capacitances that are present when tip and sample are immersed in a liquid and (b) electrochemical currents due to the effect of a polarization out of the usual tip versus electrolyte voltage window. Several applications to the study of silicon surfaces in HF solutions are shown.

AB - A new method to perform in situ current voltage curves with an electrochemical scanning tunneling microscope under bipotentiostatic control is presented. The method eliminates the effect of (a) high parasitic capacitances that are present when tip and sample are immersed in a liquid and (b) electrochemical currents due to the effect of a polarization out of the usual tip versus electrolyte voltage window. Several applications to the study of silicon surfaces in HF solutions are shown.

KW - Electrochemistry

KW - Instrumentation

KW - Scanning probe microscopy

U2 - 10.1016/S0304-3991(97)00011-9

DO - 10.1016/S0304-3991(97)00011-9

M3 - Article

VL - 66

SP - 133

EP - 139

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 3-4

ER -

A new method to perform in situ current voltage curves with an electrochemical scanning tunnelling microscope

Abstract

Keywords

Access to Document

Fingerprint

Cite this