Translated title of the contribution | A new method for the characterization of the interface roughness in thin insulating films |
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Original language | Multiple languages |
Pages (from-to) | 71-73 |
Journal | Le Vide, les couches minces |
Volume | 233 |
Publication status | Published - 1 Jan 1986 |
A new method for the characterization of the interface roughness in thin insulating films
X. Aymerich, P. Galindo, F. Campabadal, F. Serra
Research output: Contribution to journal › Article › Research