| Translated title of the contribution | A new method for the characterization of the interface roughness in thin insulating films |
|---|---|
| Original language | Multiple languages |
| Pages (from-to) | 71-73 |
| Journal | Le Vide, les couches minces |
| Volume | 233 |
| Publication status | Published - 1 Jan 1986 |
A new method for the characterization of the interface roughness in thin insulating films
X. Aymerich, P. Galindo, F. Campabadal, F. Serra
Research output: Contribution to journal › Article › Research