A new method for the characterization of the interface roughness in thin insulating films

Translated title of the contribution: A new method for the characterization of the interface roughness in thin insulating films

X. Aymerich, P. Galindo, F. Campabadal, F. Serra

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Translated title of the contributionA new method for the characterization of the interface roughness in thin insulating films
Original languageMultiple languages
Pages (from-to)71-73
JournalLe Vide, les couches minces
Volume233
Publication statusPublished - 1 Jan 1986

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