Original language | English |
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Pages (from-to) | 1519-1522 |
Journal | Microelectronic Reliability |
Volume | 44 |
DOIs | |
Publication status | Published - 1 Oct 2004 |
A new approach to the modeling of oxide breakdown on CMOS circuits
R. Fernández, R. Rodríguez, M. Nafria, X. Aymerich
Research output: Contribution to journal › Article › Research
6
Citations
(Scopus)