A mathematical morphology-based system for IC's inspection and analysis

F.X. Pérez, J. Sànchez, X. Binefa, X. Roca, J. Vitrià, J.J. Villanueva

Research output: Contribution to journalArticleResearch

Original languageEnglish
Pages (from-to)381-384
JournalJournal of Physics: Conference Series
Volume135
Publication statusPublished - 1 Jan 1994

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