A Machine Vision System for the Inspection of Industrial Sieves: VII National Symposium on Pattern Recognition and Image Analysis

A. Pujol, X. Varona, J. Serrat, A. Sanfeliu (Editor), J. Vitrià (Editor)

    Research output: Book/ReportProceedingResearch

    Original languageUndefined/Unknown
    Place of PublicationUniversitat Autónoma de Barcelona (ES)
    Number of pages2
    Publication statusPublished - Jan 1997

    Cite this