A logic-based scan-path algorithm

J. Oliver, C. Ferrer, E. Valderrama

    Research output: Chapter in BookChapterResearch

    Original languageEnglish
    Title of host publicationProceedings of the 5th International Conference on Quality in Electronic Component, Failure Prevention, Detection and Analysis, and 2nd European Symposium on Realibility of Electronic Devices, Failure
    Place of PublicationBordeus (FR)
    Number of pages6
    Publication statusPublished - 1 Jan 1991

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