@article{898cd8c9d9f94c6ba3058d3b776c9f13,
title = "A comprehensive investigation of gate oxide breakdown of P+Poly/PFETs under inversion mode",
author = "E. Wu and J. Su{\~n}{\'e} and W. Lai and A. Vayshenker and D. Harmon",
year = "2005",
month = jan,
day = "1",
language = "English",
volume = "2005",
pages = "396--399",
journal = "Technical Digest - International Electron Devices Meeting",
issn = "0163-1918",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "1609361",
}